Frans de NOOIJ

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Image sequence and evaluation method and system for structured illu...
- Patent number 9,568,304
- Issue date Feb 14, 2017
- Mitutoyo Corporation
- Han Haitjema
- G02 - OPTICS
Information Patent Grant
Structured illumination microscopy optical arrangement including pr...
- Patent number 9,182,583
- Issue date Nov 10, 2015
- Mitutoyo Corporation
- Frans De Nooij
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for determining a height of a number of spatia...
- Patent number 8,576,410
- Issue date Nov 5, 2013
- Mitutoyo Corporation
- Maarten Jozef Jansen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE SEQUENCE AND EVALUATION METHOD AND SYSTEM FOR STRUCTURED ILLU...
- Publication number 20150219441
- Publication date Aug 6, 2015
- MITUTOYO CORPORATION
- Han HAITJEMA
- G02 - OPTICS
Information Patent Application
STRUCTURED ILLUMINATION MICROSCOPY OPTICAL ARRANGEMENT INCLUDING PR...
- Publication number 20150136949
- Publication date May 21, 2015
- MITUTOYO CORPORATION
- Frans De Nooij
- G02 - OPTICS