Fransciscus G. M., De Jong

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Valkenswaard, NL

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Patents Grantslast 30 patents

Information Patent Grant
Testable integrated circuit, system in package and test instruction...
- Patent number 8,653,847
- Issue date Feb 18, 2014
- NXP, B.V.
- Fransciscus G. M. De Jong
- G01 - MEASURING TESTING
Information Patent Grant
Testable integrated circuit, system in package and test instruction...
- Patent number 7,948,243
- Issue date May 24, 2011
- NXP B.V.
- Fransciscus G. M. De Jong
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTABLE INTEGRATED CIRCUIT, SYSTEM IN PACKAGE AND TEST INSTRUCTION...
- Publication number 20110267093
- Publication date Nov 3, 2011
- NXP B.V.
- Fransciscus G. M., De Jong
- G01 - MEASURING TESTING