Fransiscus Godefridus Casper Bijnen

Person

Valkenswaard, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Alignment and alignment marks
- Patent number 7,751,047
- Issue date Jul 6, 2010
- ASML Netherlands B.V.
- Fransiscus Godefridus Casper Bijnen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical position assessment apparatus and method
- Patent number 7,477,403
- Issue date Jan 13, 2009
- ASML Netherlands B.V.
- Cheng-Qun Gui
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic apparatus and device manufacturing method
- Patent number 7,459,247
- Issue date Dec 2, 2008
- ASML Netherlands B.V.
- Fransiscus Godefridus Casper Bijnen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Alignment method, method of measuring front to backside alignment e...
- Patent number 7,420,676
- Issue date Sep 2, 2008
- ASML Netherlands B.V.
- Joeri Lof
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measurement substrate, substrate table, lithographic apparatus, met...
- Patent number 7,398,177
- Issue date Jul 8, 2008
- ASML Netherlands B.V.
- Erik Marie Jose Smeets
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Alignment tool, a lithographic apparatus, an alignment method, a de...
- Patent number 7,193,231
- Issue date Mar 20, 2007
- ASML Netherlands B.V.
- Joeri Lof
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Calibration methods, calibration substrates, lithographic apparatus...
- Patent number 6,936,385
- Issue date Aug 30, 2005
- ASML Netherlands B.V.
- Joeri Lof
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Fransiscus Godefridus Casper Bijnen

Person

Patents Grantslast 30 patents

Alignment and alignment marks

Optical position assessment apparatus and method

Lithographic apparatus and device manufacturing method

Alignment method, method of measuring front to backside alignment e...

Measurement substrate, substrate table, lithographic apparatus, met...

Alignment tool, a lithographic apparatus, an alignment method, a de...

Calibration methods, calibration substrates, lithographic apparatus...