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Frantisek Vaske
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BRNO, CZ
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last 30 patents
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Patent Grant
Specimen preparation and inspection in a dual-beam charged particle...
Patent number
10,629,409
Issue date
Apr 21, 2020
FEI Company
Frantisek Vaske
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD OF SAMPLE PREPARATON AND ANALYSIS
Publication number
20240162001
Publication date
May 16, 2024
FEI Company
Michal Valík
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
SAMPLE CARRIER FOR USE IN A CHARGED PARTICLE MICROSCOPE, AND A METH...
Publication number
20220319801
Publication date
Oct 6, 2022
FEI Company
Frantisek VASKE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SPECIMEN PREPARATION AND INSPECTION IN A DUAL-BEAM CHARGED PARTICLE...
Publication number
20190108971
Publication date
Apr 11, 2019
FEI Company
Frantisek Vaske
H01 - BASIC ELECTRIC ELEMENTS