Franz Cemic

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Weilmuenster, DE

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for inspecting an object
- Patent number 7,271,889
- Issue date Sep 18, 2007
- Leica Microsystems CMS GmbH
- Franz Cemic
- G01 - MEASURING TESTING
Information Patent Grant
Illumination device, and coordinate measuring instrument having an...
- Patent number 7,209,243
- Issue date Apr 24, 2007
- Leica Microsystems Semiconductor GmbH
- Franz Cemic
- G01 - MEASURING TESTING
Information Patent Grant
Illumination device; and coordinate measuring instrument having an...
- Patent number 6,975,409
- Issue date Dec 13, 2005
- Leica Microsystems Semiconductor GmbH
- Franz Cemic
- G01 - MEASURING TESTING
Information Patent Grant
Critical dimension measuring instrument
- Patent number 6,943,901
- Issue date Sep 13, 2005
- Leica Microsystems Semiconductor GmbH
- Franz Cemic
- G01 - MEASURING TESTING
Information Patent Grant
Autofocus module and method for a microscope-based system
- Patent number 6,879,440
- Issue date Apr 12, 2005
- Leica Microsystems Semiconductor GmbH
- Franz Cemic
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Device and method for inspecting an object
- Publication number 20050259245
- Publication date Nov 24, 2005
- LECIA MICROSYSTEMS SEMICONDUCTOR GmbH
- Franz Cemic
- G02 - OPTICS
Information Patent Application
Illumination device, and coordinate measuring instrument having an...
- Publication number 20040160777
- Publication date Aug 19, 2004
- Leica Microsystems Wetzlar GmbH
- Franz Cemic
- G02 - OPTICS
Information Patent Application
Method and microscope for detecting images of an object
- Publication number 20040120579
- Publication date Jun 24, 2004
- Leica Microsystems Semiconductor GmbH
- Franz Cemic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Critical dimension measuring instrument
- Publication number 20040070821
- Publication date Apr 15, 2004
- Leica Microsystems Semiconductor GmbH
- Franz Cemic
- G01 - MEASURING TESTING
Information Patent Application
Autofocus module and method for a microscope-based system
- Publication number 20030147134
- Publication date Aug 7, 2003
- Leica Microsystems Semiconductor GmbH
- Franz Cemic
- G02 - OPTICS
Information Patent Application
Illumination device; and coordinate measuring instrument having an...
- Publication number 20020001090
- Publication date Jan 3, 2002
- Leica Microsystems Wetzlar GmbH.
- Franz Cemic
- G01 - MEASURING TESTING