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Franz Hochwimmer
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Tiefenbach, DE
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last 30 patents
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Patent Grant
Apparatus and method for measuring the thickness of a measurement o...
Patent number
9,335,145
Issue date
May 10, 2016
Micro-Epsilon Messtechnik GmbH & Co. KG
Achim Sonntag
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Apparatus and Method for Measuring the Thickness of a Measurement O...
Publication number
20140101954
Publication date
Apr 17, 2014
MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
Achim Sonntag
G01 - MEASURING TESTING