Franz Pichl

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Ubersee, DE

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for testing electronic devices
- Patent number 9,035,669
- Issue date May 19, 2015
- Multitest Elektronische Systeme GmbH
- Franz Pichl
- G01 - MEASURING TESTING
Information Patent Grant
Plunger for holding and moving electronic components in particular ICS
- Patent number 8,232,815
- Issue date Jul 31, 2012
- Multitest Elektronische Systeme GmbH
- Max Schaule
- G01 - MEASURING TESTING
Information Patent Grant
Handler for electronic components, in particular IC's, comprising c...
- Patent number 8,138,779
- Issue date Mar 20, 2012
- Multitest Elektronische Systeme GmbH
- Stefan Thiel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR TESTING ELECTRONIC DEVICES
- Publication number 20140232423
- Publication date Aug 21, 2014
- Multitest elektronische Systeme GmbH
- Franz Pichl
- G01 - MEASURING TESTING
Information Patent Application
HANDLER FOR ELECTRONIC COMPONENTS, IN PARTICULAR IC'S, COMPRISING C...
- Publication number 20100315113
- Publication date Dec 16, 2010
- Multitest elektronische Systeme GmbH
- Stefan Thiel
- G01 - MEASURING TESTING
Information Patent Application
PLUNGER FOR HOLDING AND MOVING ELECTRONIC COMPONENTS IN PARTICULAR ICS
- Publication number 20100303589
- Publication date Dec 2, 2010
- Multitest elektronische Systeme GmbH
- Max Schaule
- G01 - MEASURING TESTING
Information Patent Application
TEMPERING CHAMBER FOR TEMPERING ELECTRONIC COMPONENTS IN PARTICULAR...
- Publication number 20100209864
- Publication date Aug 19, 2010
- Multitest elektronische Systeme GmbH
- Franz Pichl
- G01 - MEASURING TESTING