Fred Anthony Stevie

Person

Orlando, FL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Calibration standard for high resolution electron microscopy
- Patent number 6,750,447
- Issue date Jun 15, 2004
- Agere Systems, INC
- Erik Cho Houge
- G01 - MEASURING TESTING
Information Patent Grant
Abnormal photoresist line/space profile detection through signal pr...
- Patent number 6,708,574
- Issue date Mar 23, 2004
- Agere Systems, INC
- Erik Cho Houge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer particle counter
- Patent number 6,633,032
- Issue date Oct 14, 2003
- Agere Systems Inc.
- Erik Cho Houge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of focused ion beam pattern transfer using a smart dynamic t...
- Patent number 6,627,885
- Issue date Sep 30, 2003
- Agere Systems Inc.
- John M. McIntosh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration method for quantitative elemental analysis
- Patent number 6,603,119
- Issue date Aug 5, 2003
- Agere Systems Inc.
- Lucille A. Giannuzzi
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining a crystallographic quality of a material loca...
- Patent number 6,577,970
- Issue date Jun 10, 2003
- Agere Systems Inc.
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring system for determining progress in a fabrication activity
- Patent number 6,569,690
- Issue date May 27, 2003
- Agere Systems Guardian Corp.
- Erik Cho Houge
- B24 - GRINDING POLISHING
Information Patent Grant
Method of testing an unknown sample with an analytical tool
- Patent number 6,519,542
- Issue date Feb 11, 2003
- Agere Systems Inc.
- Lucille A. Giannuzzi
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method for quantitative elemental analysis
- Patent number 6,519,543
- Issue date Feb 11, 2003
- Agere Systems Inc.
- Lucille A. Giannuzzi
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip locator having improved marker arrangement for reduced bi...
- Patent number 6,425,189
- Issue date Jul 30, 2002
- Agere Systems Guardian Corp.
- Jeffrey B. Bindell
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe for scanning probe microscopy and related methods
- Patent number 6,405,584
- Issue date Jun 18, 2002
- Agere Systems Guardian Corp.
- Jeffrey Bruce Bindell
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning electron microscope/energy dispersive spectroscopy sample...
- Patent number 6,362,475
- Issue date Mar 26, 2002
- Agere Systems Guardian Corp.
- Jeffrey B. Bindell
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting semiconductor defects
- Patent number 6,297,503
- Issue date Oct 2, 2001
- Lucent Technologies Inc.
- Jeffrey B. Bindell
- G01 - MEASURING TESTING
Information Patent Grant
Method of mapping a surface using a probe for stylus nanoprofilomet...
- Patent number 6,250,143
- Issue date Jun 26, 2001
- Agere Systems Guardian Corp.
- Jeffrey B. Bindell
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Analysis of alkali elements in insulators using secondary ion mass...
- Patent number 6,229,141
- Issue date May 8, 2001
- Lucent Technologies, Inc.
- Frederick A. Stevie
- G01 - MEASURING TESTING
Information Patent Grant
Method for controlled implantation of elements into the surface or...
- Patent number 6,121,624
- Issue date Sep 19, 2000
- Lucent Technologies, Inc.
- Frederick A. Stevie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Linewidth metrology of integrated circuit structures
- Patent number 5,804,460
- Issue date Sep 8, 1998
- Lucent Technologies, Inc.
- Jeffrey Bruce Bindell
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ABNORMAL PHOTORESIST LINE/SPACE PROFILE DETECTION THROUGH SIGNAL PR...
- Publication number 20030219916
- Publication date Nov 27, 2003
- Erik Cho Houge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Calibration standard for high resolution electron microscopy
- Publication number 20030193022
- Publication date Oct 16, 2003
- Erik Cho Houge
- G01 - MEASURING TESTING
Information Patent Application
Laboratory specimen sampler with integrated specimen mount
- Publication number 20020150509
- Publication date Oct 17, 2002
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Application
Method of determining a crystallographic quality of a material loca...
- Publication number 20020128789
- Publication date Sep 12, 2002
- Erik C. Houge
- G01 - MEASURING TESTING
Information Patent Application
Mass spectrometer particle counter
- Publication number 20020063201
- Publication date May 30, 2002
- Erik Cho Houge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETERMINING THE SHAPE OF A PROBE FOR A STYLUS PROFILOMETER
- Publication number 20020062572
- Publication date May 30, 2002
- Jeffrey Bruce Bindell
- G01 - MEASURING TESTING

Fred Anthony Stevie

Person

Patents Grantslast 30 patents

Calibration standard for high resolution electron microscopy

Abnormal photoresist line/space profile detection through signal pr...

Mass spectrometer particle counter

Method of focused ion beam pattern transfer using a smart dynamic t...

Calibration method for quantitative elemental analysis

Method of determining a crystallographic quality of a material loca...

Monitoring system for determining progress in a fabrication activity

Method of testing an unknown sample with an analytical tool

Calibration method for quantitative elemental analysis

Probe tip locator having improved marker arrangement for reduced bi...

Probe for scanning probe microscopy and related methods

Scanning electron microscope/energy dispersive spectroscopy sample...

Method of detecting semiconductor defects

Method of mapping a surface using a probe for stylus nanoprofilomet...

Analysis of alkali elements in insulators using secondary ion mass...

Method for controlled implantation of elements into the surface or...

Linewidth metrology of integrated circuit structures

Patents Applicationslast 30 patents

ABNORMAL PHOTORESIST LINE/SPACE PROFILE DETECTION THROUGH SIGNAL PR...

Calibration standard for high resolution electron microscopy

Laboratory specimen sampler with integrated specimen mount

Method of determining a crystallographic quality of a material loca...

Mass spectrometer particle counter

METHOD OF DETERMINING THE SHAPE OF A PROBE FOR A STYLUS PROFILOMETER