Fred Babian

Person

Boulder Creek, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for manufacturing printed circuit board based o...
- Patent number 11,651,492
- Issue date May 16, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for printed circuit board design based on autom...
- Patent number 11,042,981
- Issue date Jun 22, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High speed X-ray microscope
- Patent number 9,646,732
- Issue date May 9, 2017
- SVXR, Inc.
- David Lewis Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
High speed x-ray inspection microscope
- Patent number 9,129,715
- Issue date Sep 8, 2015
- SVXR, Inc.
- David Lewis Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatus and method for secondary electron emission microscope
- Patent number 6,984,822
- Issue date Jan 10, 2006
- KLA-Tencor Corporation
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for secondary electron emission microscope
- Patent number 6,713,759
- Issue date Mar 30, 2004
- KLA-Tencor Corporation
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for secondary electron emission microscope
- Patent number 6,087,659
- Issue date Jul 11, 2000
- KLA-Tencor Corporation
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for secondary electron emission microscope
- Patent number 5,973,323
- Issue date Oct 26, 1999
- KLA-Tencor Corporation
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Methods and Systems for Printed Circuit Board Design Based on Autom...
- Publication number 20210279878
- Publication date Sep 9, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Defects Detection and Classification Using...
- Publication number 20210010953
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Manufacturing Printed Circuit Board based o...
- Publication number 20210014979
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Methods and Systems for Printed Circuit Board Design Based on Autom...
- Publication number 20210012054
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Detecting Defects in Devices Using X-rays
- Publication number 20210012499
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH SPEED X-RAY MICROSCOPE
- Publication number 20160351283
- Publication date Dec 1, 2016
- David Lewis Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Apparatus and method for secondary electron emission microscope
- Publication number 20030205669
- Publication date Nov 6, 2003
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for secondary electron emission microscope
- Publication number 20020104964
- Publication date Aug 8, 2002
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS

Fred Babian

Person

Patents Grantslast 30 patents

Methods and systems for manufacturing printed circuit board based o...

Methods and systems for printed circuit board design based on autom...

High speed X-ray microscope

High speed x-ray inspection microscope

Apparatus and method for secondary electron emission microscope

Apparatus and method for secondary electron emission microscope

Apparatus and method for secondary electron emission microscope

Apparatus and method for secondary electron emission microscope

Patents Applicationslast 30 patents

Methods and Systems for Printed Circuit Board Design Based on Autom...

Methods and Systems for Defects Detection and Classification Using...

Methods and Systems for Manufacturing Printed Circuit Board based o...

Methods and Systems for Printed Circuit Board Design Based on Autom...

Methods and Systems for Detecting Defects in Devices Using X-rays

HIGH SPEED X-RAY MICROSCOPE

Apparatus and method for secondary electron emission microscope

Apparatus and method for secondary electron emission microscope