Fred Duewer

Person

Albany, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Analytical scanning evanescent microwave microscope and control stage
- Patent number 8,358,141
- Issue date Jan 22, 2013
- The Regents of the University of California
- Xiao-Dong Xiang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and system for tomographic projection correction
- Patent number 8,353,628
- Issue date Jan 15, 2013
- Xradia, Inc.
- Wenbing Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for examining mineral samples with X-ray microscope and pro...
- Patent number 8,068,579
- Issue date Nov 29, 2011
- Xradia, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Analytical scanning evanescent microwave microscope and control stage
- Patent number 7,550,963
- Issue date Jun 23, 2009
- The Regents of the University of California
- Xiao-Dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Structured anode X-ray source for X-ray microscopy
- Patent number 7,443,953
- Issue date Oct 28, 2008
- Xradia, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray microscope with microfocus source and Wolter condenser
- Patent number 7,406,151
- Issue date Jul 29, 2008
- Xradia, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
High resolution direct-projection type x-ray microtomography system...
- Patent number 7,400,704
- Issue date Jul 15, 2008
- Xradia, Inc.
- Wenbing Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optimized x-ray energy for high resolution imaging of integrated ci...
- Patent number 7,394,890
- Issue date Jul 1, 2008
- Xradia, Inc.
- Yuxin Wang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray microscope capillary condenser system
- Patent number 7,170,969
- Issue date Jan 30, 2007
- Xradia, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
High resolution direct-projection type x-ray microtomography system...
- Patent number 7,130,375
- Issue date Oct 31, 2006
- Xradia, Inc.
- Wenbing Yun
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
ANALYTICAL SCANNING EVANESCENT MICROWAVE MICROSCOPE AND CONTROL STAGE
- Publication number 20090302866
- Publication date Dec 10, 2009
- The Regents of the University of California
- Xiao-Dong Xiang
- G01 - MEASURING TESTING
Information Patent Application
Analytical scanning evanescent microwave microscope and control stage
- Publication number 20060231756
- Publication date Oct 19, 2006
- Intematix Corporation
- Xiao-Dong Xiang
- G01 - MEASURING TESTING

Fred Duewer

Person

Patents Grantslast 30 patents

Analytical scanning evanescent microwave microscope and control stage

Method and system for tomographic projection correction

Process for examining mineral samples with X-ray microscope and pro...

Analytical scanning evanescent microwave microscope and control stage

Structured anode X-ray source for X-ray microscopy

X-ray microscope with microfocus source and Wolter condenser

High resolution direct-projection type x-ray microtomography system...

Optimized x-ray energy for high resolution imaging of integrated ci...

X-ray microscope capillary condenser system

High resolution direct-projection type x-ray microtomography system...

Patents Applicationslast 30 patents

ANALYTICAL SCANNING EVANESCENT MICROWAVE MICROSCOPE AND CONTROL STAGE

Analytical scanning evanescent microwave microscope and control stage