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Fred H. Pollak
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New York, NY, US
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last 30 patents
Information
Patent Grant
Contractless mode of electroreflectance
Patent number
5,287,169
Issue date
Feb 15, 1994
Brooklyn College Research and Development Foundation
Fred H. Pollak
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for determining a material's characteristics b...
Patent number
5,270,797
Issue date
Dec 14, 1993
Brooklyn College Foundation
Fred H. Pollak
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for determining a material's characteristics b...
Patent number
5,260,772
Issue date
Nov 9, 1993
Fred H. Pollak
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining interface properties of semiconductor materi...
Patent number
5,255,070
Issue date
Oct 19, 1993
Fred H. Pollak
G01 - MEASURING TESTING
Information
Patent Grant
Photoreflectance method and apparatus utilizing acousto-optic modul...
Patent number
5,255,071
Issue date
Oct 19, 1993
Fred H. Pollak
G01 - MEASURING TESTING
Information
Patent Grant
Method for in-situ determination of the fermi level in GaAs and sim...
Patent number
5,159,410
Issue date
Oct 27, 1992
Fred H. Pollak
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring variations in composition in bin...
Patent number
4,142,802
Issue date
Mar 6, 1979
Yeshiva University
Fred H. Pollak
G01 - MEASURING TESTING