Fred K. Buelow

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Los Altos Hills, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Large-scale integrated circuit with integral bi-directional test ci...
- Patent number 4,180,772
- Issue date Dec 25, 1979
- Fujitsu Limited
- Fred K. Buelow
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam exposure system method and apparatus
- Patent number 4,147,937
- Issue date Apr 3, 1979
- Fujitsu Limited
- Fred K. Buelow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Overlapping boundary electron exposure system method and apparatus
- Patent number 4,132,898
- Issue date Jan 2, 1979
- Fujitsu Limited
- Fred K. Buelow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High density multilayer printed circuit card assembly and method
- Patent number 4,016,463
- Issue date Apr 5, 1977
- Amdahl Corporation
- Robert J. Beall
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
LSI chip construction and method
- Patent number 3,981,070
- Issue date Sep 21, 1976
- Amdahl Corporation
- Fred K. Buelow
- H01 - BASIC ELECTRIC ELEMENTS