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Fred T K Cheung
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San Jose, CA, US
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last 30 patents
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Patent Grant
Method of formation of gate stack spacer and charge storage materia...
Patent number
7,163,860
Issue date
Jan 16, 2007
Spansion LLC
Tazrien Kamal
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
ONO fabrication process for increasing oxygen content at bottom oxi...
Patent number
7,033,957
Issue date
Apr 25, 2006
FASL, LLC
Hidehiko Shiraiwa
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Process for fabrication of spacer layer with reduced hydrogen conte...
Patent number
6,949,481
Issue date
Sep 27, 2005
Fasl, LLC
Arvind Halliyal
G11 - INFORMATION STORAGE