Freddie Yun Heng Chin

Person

  • Hemel Hempstead, GB

Patents Grantslast 30 patents

  • Information Patent Grant

    Micro defects in semi-conductors

    • Patent number 7,113,276
    • Issue date Sep 26, 2006
    • ASTI Operating Company, Inc.
    • Victor Higgs
    • G01 - MEASURING TESTING