Frederic Anthony Schraub

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San Luis Obispo, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for in situ monitoring of top wafer thickness in...
- Patent number 8,520,222
- Issue date Aug 27, 2013
- Strasbaugh
- Frederic Anthony Schraub
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and Method for In Situ Monitoring of Top Wafer Thickness in...
- Publication number 20130114090
- Publication date May 9, 2013
- Strasbaugh
- Frederic Anthony Schraub
- G01 - MEASURING TESTING