Frederic J. Neuveux

Person

Meylan, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Controlling clocks and resets in a logic built in self-test
- Patent number 11,132,484
- Issue date Sep 28, 2021
- Synopsys, Inc.
- Frederic Neuveux
- G01 - MEASURING TESTING
Information Patent Grant
Two-level compression through selective reseeding
- Patent number 9,157,961
- Issue date Oct 13, 2015
- Synopsys, Inc.
- Peter Wohl
- G01 - MEASURING TESTING
Information Patent Grant
Fully X-tolerant, very high scan compression scan test systems and...
- Patent number 8,645,780
- Issue date Feb 4, 2014
- Synopsys, Inc.
- Peter Wohl
- G01 - MEASURING TESTING
Information Patent Grant
Fully X-tolerant, very high scan compression scan test systems and...
- Patent number 8,464,115
- Issue date Jun 11, 2013
- Synopsys, Inc.
- Peter Wohl
- G01 - MEASURING TESTING
Information Patent Grant
Fully X-tolerant, very high scan compression scan test systems and...
- Patent number 7,979,763
- Issue date Jul 12, 2011
- Synopsys, Inc.
- Peter Wohl
- G01 - MEASURING TESTING
Information Patent Grant
Increasing scan compression by using X-chains
- Patent number 7,958,472
- Issue date Jun 7, 2011
- Synopsys, Inc.
- Peter Wohl
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,900,105
- Issue date Mar 1, 2011
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,836,367
- Issue date Nov 16, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,836,368
- Issue date Nov 16, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Pipeline of additional storage elements to shift input/output data...
- Patent number 7,823,034
- Issue date Oct 26, 2010
- Synopsys, Inc.
- Peter Wohl
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,774,663
- Issue date Aug 10, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,743,299
- Issue date Jun 22, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,596,733
- Issue date Sep 29, 2009
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,418,640
- Issue date Aug 26, 2008
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Two-Level Compression Through Selective Reseeding
- Publication number 20140281774
- Publication date Sep 18, 2014
- Synopsys, Inc.
- Peter Wohl
- G01 - MEASURING TESTING
Information Patent Application
Fully X-Tolerant, Very High Scan Compression Scan Test Systems And...
- Publication number 20130268817
- Publication date Oct 10, 2013
- Peter Wohl
- G01 - MEASURING TESTING
Information Patent Application
Fully X-tolerant, Very High Scan Compression Scan Test Systems And...
- Publication number 20110258503
- Publication date Oct 20, 2011
- Synopsys, Inc.
- Peter Wohl
- G01 - MEASURING TESTING
Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20100223516
- Publication date Sep 2, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Fully X-Tolerant, Very High Scan Compression Scan Test Systems And...
- Publication number 20100100781
- Publication date Apr 22, 2010
- Synopsys, Inc.
- Peter Wohl
- G01 - MEASURING TESTING
Information Patent Application
Increasing Scan Compression By Using X-Chains
- Publication number 20100083199
- Publication date Apr 1, 2010
- Synopsys, Inc.
- Peter Wohl
- G01 - MEASURING TESTING
Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20100031101
- Publication date Feb 4, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20090313514
- Publication date Dec 17, 2009
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20090271673
- Publication date Oct 29, 2009
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20080301510
- Publication date Dec 4, 2008
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20080294955
- Publication date Nov 27, 2008
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Pipeline of additional storage elements to shift input/output data...
- Publication number 20080256274
- Publication date Oct 16, 2008
- Synopsys, Inc.
- Peter Wohl
- G01 - MEASURING TESTING
Information Patent Application
Dynamically reconfigurable shared scan-in test architecture
- Publication number 20050268190
- Publication date Dec 1, 2005
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING

Frederic J. Neuveux

Person

Patents Grantslast 30 patents

Controlling clocks and resets in a logic built in self-test

Two-level compression through selective reseeding

Fully X-tolerant, very high scan compression scan test systems and...

Fully X-tolerant, very high scan compression scan test systems and...

Fully X-tolerant, very high scan compression scan test systems and...

Increasing scan compression by using X-chains

Dynamically reconfigurable shared scan-in test architecture

Dynamically reconfigurable shared scan-in test architecture

Dynamically reconfigurable shared scan-in test architecture

Pipeline of additional storage elements to shift input/output data...

Dynamically reconfigurable shared scan-in test architecture

Dynamically reconfigurable shared scan-in test architecture

Dynamically reconfigurable shared scan-in test architecture

Dynamically reconfigurable shared scan-in test architecture

Patents Applicationslast 30 patents

Two-Level Compression Through Selective Reseeding

Fully X-Tolerant, Very High Scan Compression Scan Test Systems And...

Fully X-tolerant, Very High Scan Compression Scan Test Systems And...

Dynamically Reconfigurable Shared Scan-In Test Architecture

Fully X-Tolerant, Very High Scan Compression Scan Test Systems And...

Increasing Scan Compression By Using X-Chains

Dynamically Reconfigurable Shared Scan-In Test Architecture

Dynamically Reconfigurable Shared Scan-In Test Architecture

Dynamically Reconfigurable Shared Scan-In Test Architecture

Dynamically Reconfigurable Shared Scan-In Test Architecture

Dynamically Reconfigurable Shared Scan-In Test Architecture

Pipeline of additional storage elements to shift input/output data...

Dynamically reconfigurable shared scan-in test architecture