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Frederick A. Azinger
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Portland, OR, US
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Patents Grants
last 30 patents
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Patent Grant
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Patent number
6,847,349
Issue date
Jan 25, 2005
Tektronix, Inc.
Frederick A. Azinger
G01 - MEASURING TESTING
Information
Patent Grant
Calibration method and apparatus for signal analysis device
Patent number
6,801,042
Issue date
Oct 5, 2004
Tektronix, Inc.
Mark E. Mc Pherson
G01 - MEASURING TESTING
Information
Patent Grant
Continually responsive and anticipating automatic setup function fo...
Patent number
6,571,185
Issue date
May 27, 2003
Tektronix, Inc.
Michael A. Gauland
G01 - MEASURING TESTING
Information
Patent Grant
Oscilloscope with simplified setup procedure, and procedure for set...
Patent number
6,525,525
Issue date
Feb 25, 2003
Tektronix, Inc.
Frederick A. Azinger
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Automated storage of unique waveforms presented as an oscilloscope...
Publication number
20040189636
Publication date
Sep 30, 2004
Frederick A. Azinger
G01 - MEASURING TESTING
Information
Patent Application
Calibration method and apparatus for signal analysis device
Publication number
20030112017
Publication date
Jun 19, 2003
Mark E. Mc Pherson
G01 - MEASURING TESTING
Information
Patent Application
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Publication number
20030095099
Publication date
May 22, 2003
Frederick A. Azinger
G01 - MEASURING TESTING