TREA

Frederick H. Roy III

Follow

Person

  • Burlington, VT, US
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Probe card assembly
    • Patent number 11,085,949
    • Issue date Aug 10, 2021
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card assembly
    • Patent number 10,578,648
    • Issue date Mar 3, 2020
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Solder bump array probe tip structure for laser cleaning
    • Patent number 10,571,490
    • Issue date Feb 25, 2020
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Solder bump array probe tip structure for laser cleaning
    • Patent number 9,835,653
    • Issue date Dec 5, 2017
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card assembly
    • Patent number 9,797,928
    • Issue date Oct 24, 2017
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE CARD ASSEMBLY
    • Publication number 20200049738
    • Publication date Feb 13, 2020
    • International Business Machines Corporation
    • David M. AUDETTE
    • G01 - MEASURING TESTING
  • Information Patent Application

    SOLDER BUMP ARRAY PROBE TIP STRUCTURE FOR LASER CLEANING
    • Publication number 20180059141
    • Publication date Mar 1, 2018
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD ASSEMBLY
    • Publication number 20170356933
    • Publication date Dec 14, 2017
    • International Business Machines Corporation
    • David M. AUDETTE
    • G01 - MEASURING TESTING
  • Information Patent Application

    ORGANIC PROBE SUBSTRATE
    • Publication number 20170003318
    • Publication date Jan 5, 2017
    • International Business Machines Corporation
    • David M. AUDETTE
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD ASSEMBLY
    • Publication number 20160077129
    • Publication date Mar 17, 2016
    • International Business Machines Corporation
    • David M. AUDETTE
    • G01 - MEASURING TESTING
  • Information Patent Application

    SOLDER BUMP ARRAY PROBE TIP STRUCTURE FOR LASER CLEANING
    • Publication number 20150331014
    • Publication date Nov 19, 2015
    • International Business Machines Corporation
    • David M. Audette
    • G01 - MEASURING TESTING