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Frederick L. Taber Jr.
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LaGrangeville, NY, US
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Patents Grants
last 30 patents
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Patent Grant
Wafer probe interface arrangement with nonresilient probe elements...
Patent number
6,426,636
Issue date
Jul 30, 2002
International Business Machines Corporation
Gobinda Das
G01 - MEASURING TESTING
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Patent Grant
Large area multiple-chip probe assembly and method of making the same
Patent number
5,977,787
Issue date
Nov 2, 1999
International Business Machines Corporation
Gobina Das
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SYSTEM AND METHOD FOR ASSEMBLING A PROBE HEAD
Publication number
20150054537
Publication date
Feb 26, 2015
Corad Technology Inc.
Frederick L. Taber
G01 - MEASURING TESTING