Frederick P. LaPlant

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Ann Arbor, MI, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for processing measurement signals to obtain a va...
- Patent number 6,769,307
- Issue date Aug 3, 2004
- Perceptron, Inc.
- John W. Dixon
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for processing measurement signals to obtain a va...
- Patent number 6,481,289
- Issue date Nov 19, 2002
- Perceptron, Inc.
- John W. Dixon
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring a physical parameter of at least on...
- Patent number 6,128,081
- Issue date Oct 3, 2000
- Perceptron, Inc.
- Jeffrey S. White
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for processing measurement signals to obtain a va...
- Patent number 6,092,419
- Issue date Jul 25, 2000
- Perceptron, Inc.
- John W. Dixon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and system for processing measurement signals to obtain a va...
- Publication number 20020152813
- Publication date Oct 24, 2002
- John W. Dixon
- G01 - MEASURING TESTING