Fredericus Bernardus Kiewiet

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Beam pulsing device for use in charged-particle microscopy
- Patent number 9,048,060
- Issue date Jun 2, 2015
- FEI Company
- Erik René Kieft
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam blanker for interrupting a beam of charged particles
- Patent number 8,569,712
- Issue date Oct 29, 2013
- FEI Company
- Guido Martinus Henricus Knippels
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
BEAM PULSING DEVICE FOR USE IN CHARGED-PARTICLE MICROSCOPY
- Publication number 20140103225
- Publication date Apr 17, 2014
- FEI Company
- Erik René Kieft
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Beam Blanker for Interrupting a Beam of Charged Particles
- Publication number 20120261586
- Publication date Oct 18, 2012
- FEI Company
- Guido Martinus Henricus Knippels
- H01 - BASIC ELECTRIC ELEMENTS