Frederik Büchau-Vender

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Berlin, DE

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Patents Grantslast 30 patents

Information Patent Grant
Compensating control signal for raster scan of a scanning probe mic...
- Patent number 11,656,244
- Issue date May 23, 2023
- Bruker Nano GmbH
- Wolfgang Dobler
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Arrangement Having a Measuring Apparatus for a Scanning Probe Micro...
- Publication number 20220244287
- Publication date Aug 4, 2022
- BRUKER NANO GMBH
- Torsten Jahnke
- G01 - MEASURING TESTING
Information Patent Application
Measuring Device for a Scanning Probe Microscope and Method for Sca...
- Publication number 20210190818
- Publication date Jun 24, 2021
- BRUKER NANO GMBH
- Wolfgang Dobler
- G01 - MEASURING TESTING