Fritz-Jurgen Hohn

Person

Armonk, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray mask containing a cantilevered tip for gap control and alignment
- Patent number 5,150,392
- Issue date Sep 22, 1992
- International Business Machines Corporation
- Fritz J. Hohn
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for opens/shorts testing of capacitively coupled networks in...
- Patent number 5,057,773
- Issue date Oct 15, 1991
- International Business Machines Corporation
- Steven D. Golladay
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for opens/shorts testing of capacitively coupl...
- Patent number 4,943,769
- Issue date Jul 24, 1990
- International Business Machines Corporation
- Steven D. Golladay
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam lithography alignment using electric field changes to...
- Patent number 4,871,919
- Issue date Oct 3, 1989
- International Business Machines Corporation
- Thomas P. Donohue
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electron beam contactless testing system with grid bias switching
- Patent number 4,843,330
- Issue date Jun 27, 1989
- International Business Machines Corporation
- Steven D. Golladay
- G01 - MEASURING TESTING
Information Patent Grant
Inspection of unsintered single layer or multilayer ceramics using...
- Patent number 4,621,232
- Issue date Nov 4, 1986
- International Business Machines Corporation
- Tai-Hon P. Chang
- G01 - MEASURING TESTING
Information Patent Grant
Single crystal lanthanum hexaboride electron beam emitter having hi...
- Patent number 4,486,684
- Issue date Dec 4, 1984
- International Business Machines Corporation
- Fritz-Jurgen Hohn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shaped electron emission from single crystal lanthanum hexaboride w...
- Patent number 4,468,586
- Issue date Aug 28, 1984
- International Business Machines Corporation
- Fritz-Jurgen Hohn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam potential switching apparatus
- Patent number 4,426,583
- Issue date Jan 17, 1984
- International Business Machines Corporation
- Tai-Hon P. Chang
- H01 - BASIC ELECTRIC ELEMENTS

Fritz-Jurgen Hohn

Person

Patents Grantslast 30 patents

X-ray mask containing a cantilevered tip for gap control and alignment

Method for opens/shorts testing of capacitively coupled networks in...

Apparatus and method for opens/shorts testing of capacitively coupl...

Electron beam lithography alignment using electric field changes to...

Electron beam contactless testing system with grid bias switching

Inspection of unsintered single layer or multilayer ceramics using...

Single crystal lanthanum hexaboride electron beam emitter having hi...

Shaped electron emission from single crystal lanthanum hexaboride w...

Electron beam potential switching apparatus