Fujio Hara

Person

Saitama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Anisotropic conductive connector and inspection equipment of circui...
- Patent number 7,922,497
- Issue date Apr 12, 2011
- JSR Corporation
- Daisuke Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board apparatus for wafer inspection, probe card, and wafer...
- Patent number 7,821,283
- Issue date Oct 26, 2010
- JSR Corporation
- Daisuke Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Composite conductive sheet, method for producing the same, anisotro...
- Patent number 7,705,618
- Issue date Apr 27, 2010
- JSR Corporation
- Kiyoshi Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Connector for measuring electrical resistance, and apparatus and me...
- Patent number 7,675,303
- Issue date Mar 9, 2010
- JSR Corporation
- Kiyoshi Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Inspection equipment of circuit board and inspection method of circ...
- Patent number 7,489,147
- Issue date Feb 10, 2009
- JSR Corporation
- Kiyoshi Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Connector for measuring electric resistance, apparatus and method f...
- Patent number 7,038,471
- Issue date May 2, 2006
- JSR Corporation
- Kiyoshi Kimura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANISOTROPIC CONDUCTIVE CONNECTOR AND INSPECTION EQUIPMENT OF CIRCUI...
- Publication number 20090230975
- Publication date Sep 17, 2009
- JSR CORPORATION
- Daisuke Yamada
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR INSPECTING CIRCUIT BOARD AND METHOD OF INSPECTING CIR...
- Publication number 20090153146
- Publication date Jun 18, 2009
- JSR Corporation
- Kiyoshi Kimura
- G01 - MEASURING TESTING
Information Patent Application
CONNECTOR FOR MEASURING ELECTRICAL RESISTANCE, AND APPARATUS AND ME...
- Publication number 20090121730
- Publication date May 14, 2009
- JSR Corporation
- Kiyoshi Kimura
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTING SHEET-LIKE PROBE AND APPLICATION THEREOF
- Publication number 20090072844
- Publication date Mar 19, 2009
- JSR CORPORATION
- Kiyoshi Kimura
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD APPARATUS FOR WAFER INSPECTION, PROBE CARD, AND WAFER...
- Publication number 20090039906
- Publication date Feb 12, 2009
- JSR Corporation
- Daisuke Yamada
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE CONDUCTIVE SHEET, METHOD FOR PRODUCING THE SAME, ANISOTRO...
- Publication number 20090039905
- Publication date Feb 12, 2009
- JSR Corporation
- Kiyoshi Kimura
- G01 - MEASURING TESTING
Information Patent Application
Inspection Equipment of Circuit Board and Inspection Method of Circ...
- Publication number 20080054921
- Publication date Mar 6, 2008
- Kiyoshi Kimura
- G01 - MEASURING TESTING
Information Patent Application
Connector for measurement of electric resistance, connector device...
- Publication number 20060176064
- Publication date Aug 10, 2006
- JSR Corporation
- Kiyoshi Kimura
- G01 - MEASURING TESTING
Information Patent Application
Anisotropic conductive sheet and its manufacturing method, adaptor...
- Publication number 20060134378
- Publication date Jun 22, 2006
- JSR Corporation
- Kiyoshi Kimura
- G01 - MEASURING TESTING
Information Patent Application
Connector for measuring electric resistance, apparatus and method f...
- Publication number 20050146336
- Publication date Jul 7, 2005
- Kiyoshi Kimura
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Anisotropic conductive connector and inspection equipment of circui...

Circuit board apparatus for wafer inspection, probe card, and wafer...

Composite conductive sheet, method for producing the same, anisotro...

Connector for measuring electrical resistance, and apparatus and me...

Inspection equipment of circuit board and inspection method of circ...

Connector for measuring electric resistance, apparatus and method f...

Patents Applicationslast 30 patents

ANISOTROPIC CONDUCTIVE CONNECTOR AND INSPECTION EQUIPMENT OF CIRCUI...

APPARATUS FOR INSPECTING CIRCUIT BOARD AND METHOD OF INSPECTING CIR...

CONNECTOR FOR MEASURING ELECTRICAL RESISTANCE, AND APPARATUS AND ME...

WAFER INSPECTING SHEET-LIKE PROBE AND APPLICATION THEREOF

CIRCUIT BOARD APPARATUS FOR WAFER INSPECTION, PROBE CARD, AND WAFER...

COMPOSITE CONDUCTIVE SHEET, METHOD FOR PRODUCING THE SAME, ANISOTRO...

Inspection Equipment of Circuit Board and Inspection Method of Circ...

Connector for measurement of electric resistance, connector device...

Anisotropic conductive sheet and its manufacturing method, adaptor...

Connector for measuring electric resistance, apparatus and method f...