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Fujio Maeda
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Yokohama, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Light source device and photoelectric encoder including the same
Patent number
10,416,002
Issue date
Sep 17, 2019
Mitutoyo Corporation
Miyako Mizutani
G01 - MEASURING TESTING
Information
Patent Grant
Induction type position measuring apparatus
Patent number
9,568,300
Issue date
Feb 14, 2017
Mitutoyo Corporation
Shozaburo Tsuji
G01 - MEASURING TESTING
Information
Patent Grant
Linear encoder
Patent number
9,506,778
Issue date
Nov 29, 2016
Mitutoyo Corporation
Shozaburo Tsuji
G01 - MEASURING TESTING
Information
Patent Grant
Scale for photoelectric encoder
Patent number
9,310,225
Issue date
Apr 12, 2016
Mitutoyo Corporation
Fujio Maeda
G01 - MEASURING TESTING
Information
Patent Grant
Scale of photoelectric encoder including base member having roughen...
Patent number
9,258,007
Issue date
Feb 9, 2016
Mitutoyo Corporation
Toshihiko Aoki
G01 - MEASURING TESTING
Information
Patent Grant
Surface reflection encoder scale and surface reflection encoder usi...
Patent number
7,916,305
Issue date
Mar 29, 2011
Mitutoyo Corporation
Fujio Maeda
G01 - MEASURING TESTING
Information
Patent Grant
Digital display type measuring instrument
Patent number
4,765,064
Issue date
Aug 23, 1988
Mitutoyo Corporation
Fujio Maeda
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LIGHT SOURCE DEVICE AND PHOTOELECTRIC ENCODER INCLUDING THE SAME
Publication number
20180106646
Publication date
Apr 19, 2018
Mitutoyo Corporation
Miyako Mizutani
G01 - MEASURING TESTING
Information
Patent Application
LINEAR ENCODER
Publication number
20150219475
Publication date
Aug 6, 2015
Mitutoyo Corporation
Shozaburo Tsuji
G01 - MEASURING TESTING
Information
Patent Application
INDUCTION TYPE POSITION MEASURING APPARATUS
Publication number
20150219434
Publication date
Aug 6, 2015
Mitutoyo Corporation
Shozaburo Tsuji
G01 - MEASURING TESTING
Information
Patent Application
SCALE FOR PHOTOELECTRIC ENCODER
Publication number
20140367560
Publication date
Dec 18, 2014
MITUTOYO CORPORATION
Fujio MAEDA
G01 - MEASURING TESTING
Information
Patent Application
SCALE OF PHOTOELECTRIC ENCODER AND MANUFACTURING METHOD OF THE SAME
Publication number
20130127644
Publication date
May 23, 2013
Mitutoyo Corporation
Toshihiko Aoki
G01 - MEASURING TESTING
Information
Patent Application
SURFACE REFLECTION ENCODER SCALE AND SURFACE REFLECTION ENCODER USI...
Publication number
20080316493
Publication date
Dec 25, 2008
Mitutoyo Corporation
Fujio Maeda
G02 - OPTICS