Fujio Onishi

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Automatic analyzer and optical measurement method
- Patent number 11,493,430
- Issue date Nov 8, 2022
- HITACHI HIGH-TECH CORPORATION
- Kosuke Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Light amount detection device, immune analyzing apparatus and charg...
- Patent number 10,168,208
- Issue date Jan 1, 2019
- Hitachi High-Technologies Corporation
- Yutaka Kasai
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device provided with ion pump
- Patent number 10,121,631
- Issue date Nov 6, 2018
- Hitachi High-Technologies Corporation
- Masazumi Tone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light signal detecting circuit, light amount detecting device, and...
- Patent number 9,322,711
- Issue date Apr 26, 2016
- Hitachi High-Technologies Corporation
- Fujio Onishi
- G01 - MEASURING TESTING
Information Patent Grant
Light quantity detection method and device therefor
- Patent number 8,797,522
- Issue date Aug 5, 2014
- Hitachi High-Technologies Corporation
- Akihiro Namba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC ANALYZER AND OPTICAL MEASUREMENT METHOD
- Publication number 20210310933
- Publication date Oct 7, 2021
- Kosuke Suzuki
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE PROVIDED WITH ION PUMP
- Publication number 20180158648
- Publication date Jun 7, 2018
- Hitachi High-Technologies Corporation
- Masazumi TONE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT AMOUNT DETECTION DEVICE, IMMUNE ANALYZING APPARATUS AND CHARG...
- Publication number 20180066986
- Publication date Mar 8, 2018
- Hitachi High-Technologies Corporation
- Yutaka KASAI
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SIGNAL DETECTING CIRCUIT, LIGHT AMOUNT DETECTING DEVICE, AND...
- Publication number 20150153223
- Publication date Jun 4, 2015
- Fujio Onishi
- G01 - MEASURING TESTING
Information Patent Application
Light Quantity Detection Method and Device Therefor
- Publication number 20130114073
- Publication date May 9, 2013
- Hitachi High-Technologies Corporation
- Akihiro Namba
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED MEDIUM INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20120194939
- Publication date Aug 2, 2012
- Takuma NISHIMOTO
- G11 - INFORMATION STORAGE