Fukumi UNOKUCHI

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Gunma, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 11,860,225
- Issue date Jan 2, 2024
- Renesas Electronics Corporation
- Fukumi Unokuchi
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 10,001,510
- Issue date Jun 19, 2018
- Renesas Electronics Corporation
- Fukumi Unokuchi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20230266386
- Publication date Aug 24, 2023
- RENESAS ELECTRONICS CORPORATION
- Fukumi UNOKUCHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20180292434
- Publication date Oct 11, 2018
- RENESAS ELECTRONICS CORPORATION
- Fukumi UNOKUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20170160311
- Publication date Jun 8, 2017
- RENESAS ELECTRONICS CORPORATION
- Fukumi UNOKUCHI
- G01 - MEASURING TESTING