Fumihiro SAITO

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Musashino-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor test system
- Patent number 7,849,375
- Issue date Dec 7, 2010
- Yokogawa Electric Corporation
- Fumihiro Saito
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED MANAGEMENT SYSTEM, INTEGRATED MANAGEMENT METHOD, AND INT...
- Publication number 20230280727
- Publication date Sep 7, 2023
- Yokogawa Solution Service Corporation
- Masato KATSUKI
- G05 - CONTROLLING REGULATING
Information Patent Application
PRODUCTION MANAGEMENT SYSTEM, PRODUCTION MANAGEMENT METHOD, AND PRO...
- Publication number 20230280730
- Publication date Sep 7, 2023
- Yokogawa Solution Service Corporation
- Masato KATSUKI
- G05 - CONTROLLING REGULATING
Information Patent Application
PRODUCTION MANAGEMENT SYSTEM, PRODUCTION MANAGEMENT METHOD, AND PRO...
- Publication number 20230280731
- Publication date Sep 7, 2023
- Yokogawa Solution Service Corporation
- Masato KATSUKI
- G05 - CONTROLLING REGULATING
Information Patent Application
LEARNING APPARATUS, EVALUATION APPARATUS, EVALUATION SYSTEM, LEARNI...
- Publication number 20220284346
- Publication date Sep 8, 2022
- YOKOGAWA ELECTRIC CORPORATION
- Hiroaki KANOKOGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR TEST SYSTEM
- Publication number 20080301512
- Publication date Dec 4, 2008
- Yokogawa Electric Corporation
- Fumihiro SAITO
- G06 - COMPUTING CALCULATING COUNTING