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Fumikazu Itoh
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Fujisawa, JP
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last 30 patents
Information
Patent Grant
Method of making wiring and logic corrections on a semiconductor de...
Patent number
6,753,253
Issue date
Jun 22, 2004
Hitachi, Ltd.
Takahiko Takahashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Processing method and apparatus using focused ion beam generating m...
Patent number
5,825,035
Issue date
Oct 20, 1998
Hitachi, Ltd.
Michinobu Mizumura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Processing method and apparatus using focused energy beam
Patent number
5,683,547
Issue date
Nov 4, 1997
Hitachi, Ltd.
Junzou Azuma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for making specimen and apparatus thereof
Patent number
5,656,811
Issue date
Aug 12, 1997
Hitachi, Ltd.
Fumikazu Itoh
G01 - MEASURING TESTING
Information
Patent Grant
Process method and apparatus using focused ion beam generating means
Patent number
5,583,344
Issue date
Dec 10, 1996
Hitachi, Ltd.
Michinobu Mizumura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process method and apparatus using focused ion beam generating means
Patent number
5,504,340
Issue date
Apr 2, 1996
Hitachi, Ltd.
Michinobu Mizumura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of processing a sample using a charged beam and reactive gas...
Patent number
5,447,614
Issue date
Sep 5, 1995
Hitachi, Ltd.
Yuuichi Hamamura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical mask and method of correcting the same
Patent number
5,439,763
Issue date
Aug 8, 1995
Hitachi, Ltd.
Akira Shimase
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Phase shift mask, method of correcting the same and apparatus for c...
Patent number
5,358,806
Issue date
Oct 25, 1994
Hitachi, Ltd.
Satoshi Haraichi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Apparatus for processing a sample using a charged beam and reactive...
Patent number
5,342,448
Issue date
Aug 30, 1994
Hitachi, Ltd.
Yuuichi Hamamura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Combination apparatus having a scanning electron microscope therein
Patent number
5,229,607
Issue date
Jul 20, 1993
Hitachi, Ltd.
Hironobu Matsui
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Ion beam processing method and apparatus
Patent number
5,223,109
Issue date
Jun 29, 1993
Hitachi, Ltd.
Fumikazu Itoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device having superlattice structure, and method of and apparatus f...
Patent number
5,113,072
Issue date
May 12, 1992
Hitachi, Ltd.
Hiroshi Yamaguchi
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method of etching a semiconductor device by an ion beam
Patent number
5,086,015
Issue date
Feb 4, 1992
Hitachi, Ltd.
Fumikazu Itoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multilayered device micro etching method and system
Patent number
5,055,696
Issue date
Oct 8, 1991
Hitachi, Ltd.
Satoshi Haraichi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of providing a semiconductor IC device with an additional co...
Patent number
5,026,664
Issue date
Jun 25, 1991
Hitachi, Ltd.
Mikio Hongo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing devices having superlattice structures
Patent number
4,983,540
Issue date
Jan 8, 1991
Hitachi, Ltd.
Hiroshi Yamaguchi
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Coil winding and inserting machine
Patent number
4,449,293
Issue date
May 22, 1984
Hitachi, Ltd.
Fumikazu Itoh
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Machine for winding and inserting coils
Patent number
4,299,023
Issue date
Nov 10, 1981
Hitachi, Ltd.
Minoru Tanaka
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Winding machine
Patent number
4,184,644
Issue date
Jan 22, 1980
Hitachi, Ltd.
Fumikazu Itoh
H01 - BASIC ELECTRIC ELEMENTS