FUMIKAZU TAKAYANAGI

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Patents Grantslast 30 patents

Information Patent Grant
Micro-switch device and method for manufacturing the same
- Patent number 7,554,136
- Issue date Jun 30, 2009
- Advantest Corporation
- Fumikazu Takayanagi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Bimorph element, bimorph switch, mirror element, and method for man...
- Patent number 7,477,003
- Issue date Jan 13, 2009
- Advantest Corporation
- Fumikazu Takayanagi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Probe module and a testing apparatus
- Patent number 6,937,040
- Issue date Aug 30, 2005
- Advantest Corporation
- Yasuhiro Maeda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTROMAGNETIC WAVE MEASUREMENT DEVICE, MEASUREMENT METHOD, PROGRA...
- Publication number 20170074803
- Publication date Mar 16, 2017
- Advantest Corporation
- Fumikazu TAKAYANAGI
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE MEASUREMENT DEVICE, MEASUREMENT METHOD, PROGRA...
- Publication number 20170074804
- Publication date Mar 16, 2017
- Advantest Corporation
- Fumikazu TAKAYANAGI
- G01 - MEASURING TESTING
Information Patent Application
BIMORPH ELEMENT, BIMORPH SWITCH, MIRROR ELEMENT, AND METHOD FOR MAN...
- Publication number 20070194656
- Publication date Aug 23, 2007
- Advantest Corporation
- FUMIKAZU TAKAYANAGI
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Micro device and method for manufacturing the same
- Publication number 20050218530
- Publication date Oct 6, 2005
- Advantest Corporation
- Fumikazu Takayanagi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Probe module and a testing apparatus
- Publication number 20040212379
- Publication date Oct 28, 2004
- Yasuhiro Maeda
- G01 - MEASURING TESTING