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Fumiki Sakai
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Tokyo, JP
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last 30 patents
Information
Patent Grant
Sampling scanning probe microscope and sampling method thereof
Patent number
6,094,972
Issue date
Aug 1, 2000
Seiko Instruments Inc.
Masatoshi Yasutake
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Tunnel current detecting photo-acoustic spectrometer
Patent number
4,921,346
Issue date
May 1, 1990
Agency of Industrial Science and Technology
Hiroshi Tokumoto
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Relative displacement control apparatus
Patent number
4,866,271
Issue date
Sep 12, 1989
Agency of Industrial Science and Technology
Masatoshi Ono
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Tunneling scanning microscope having light source
Patent number
4,837,435
Issue date
Jun 6, 1989
Seiko Instruments Inc.
Toshihiko Sakuhara
B82 - NANO-TECHNOLOGY