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Beijing, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Metal seal for ultra high vacuum system
Patent number
9,581,245
Issue date
Feb 28, 2017
Hermes-Microvision, Inc.
Qingpo Xi
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
High efficiency secondary and back scattered electron detector
Patent number
8,895,935
Issue date
Nov 25, 2014
Hermes-Microvision, Inc.
Zhibin Wang
G01 - MEASURING TESTING
Information
Patent Grant
High efficiency scintillator detector for charged particle detection
Patent number
8,829,451
Issue date
Sep 9, 2014
Hermes-Microvision, Inc.
Zhibin Wang
G01 - MEASURING TESTING
Information
Patent Grant
Electron beam apparatus
Patent number
7,960,697
Issue date
Jun 14, 2011
Hermes-Microvision, Inc.
Zhongwei Chen
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METAL SEAL FOR ULTRA HIGH VACUUM SYSTEM
Publication number
20150091258
Publication date
Apr 2, 2015
HERMES MICROVISION, INC.
Qingpo XI
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Application
HIGH EFFICIENCY SCINTILLATOR DETECTOR FOR CHARGED PARTICLE DETECTION
Publication number
20130334430
Publication date
Dec 19, 2013
HERMES MICROVISION, INC.
Zhibin Wang
G01 - MEASURING TESTING
Information
Patent Application
METAL SEAL FOR ULTRA HIGH VACUUM SYSTEM
Publication number
20130257044
Publication date
Oct 3, 2013
Hermes Microvision, Inc.
Qingpo XI
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Application
HIGH EFFICIENCY SECONDARY AND BACK SCATTERED ELECTRON DETECTOR
Publication number
20130234032
Publication date
Sep 12, 2013
HERMES MICROVISION, INC.
Zhibin Wang
G01 - MEASURING TESTING
Information
Patent Application
ELECTRON BEAM APPARATUS
Publication number
20100102227
Publication date
Apr 29, 2010
HERMES-MICROVISION, INC
ZHONGWEI CHEN
H01 - BASIC ELECTRIC ELEMENTS