Fuminobu Komura

Person

Kouhoku-ku, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Variation detecting apparatus, variation detecting method, and stor...
- Patent number 7,027,653
- Issue date Apr 11, 2006
- Hitachi Software Engineering Co., Ltd.
- Takashi Hino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Decision making method
- Patent number 5,870,730
- Issue date Feb 9, 1999
- Hitachi, Ltd.
- Masatoshi Furuya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for cooperatively operating river management facilities
- Patent number 5,812,421
- Issue date Sep 22, 1998
- Hitachi, Ltd.
- Kenji Fujii
- E02 - HYDRAULIC ENGINEERING FOUNDATIONS SOIL SHIFTING
Information Patent Grant
Emergency information offering system
- Patent number 5,689,233
- Issue date Nov 18, 1997
- Hitachi, Ltd.
- Hiromitsu Kurisu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scheduled motion planning method and apparatus for a vehicle
- Patent number 5,550,742
- Issue date Aug 27, 1996
- Hitachi, Ltd.
- Masatoshi Furuya
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for retrieving database of image information
- Patent number 5,546,572
- Issue date Aug 13, 1996
- Hitachi, Ltd.
- Youichi Seto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Navigation system and method using map data
- Patent number 5,311,173
- Issue date May 10, 1994
- Hitachi, Ltd.
- Fuminobu Komura
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope and method of processing the same
- Patent number 5,001,344
- Issue date Mar 19, 1991
- Hitachi, Ltd.
- Makoto Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring surface topography by using scanning electron m...
- Patent number 4,912,313
- Issue date Mar 27, 1990
- Hitachi Ltd.
- Makoto Kato
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting change using image
- Patent number 4,912,770
- Issue date Mar 27, 1990
- Hitachi, Ltd.
- Youichi Seto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image correction system for scanning electron microscope
- Patent number 4,907,287
- Issue date Mar 6, 1990
- Hitachi, Ltd.
- Koichi Homma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope
- Patent number 4,803,358
- Issue date Feb 7, 1989
- Hitachi, Ltd.
- Makoto Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of reconstructing images from synthetic aperture radar's data
- Patent number 4,758,838
- Issue date Jul 19, 1988
- Hitachi, Ltd.
- Akira Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for detecting heights of points on surface...
- Patent number 4,700,398
- Issue date Oct 13, 1987
- Hitachi, Ltd.
- Hirotaka Mizuno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image correction processing method
- Patent number 4,695,964
- Issue date Sep 22, 1987
- Hitachi, Ltd.
- Youichi Seto
- G01 - MEASURING TESTING
Information Patent Grant
Image correction processing method and apparatus
- Patent number 4,682,300
- Issue date Jul 21, 1987
- Hitachi, Ltd.
- Youichi Seto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Variation detecting apparatus, variation detecting method, and stor...
- Publication number 20020060734
- Publication date May 23, 2002
- Takashi Hino
- G06 - COMPUTING CALCULATING COUNTING

Fuminobu Komura

Person

Patents Grantslast 30 patents

Variation detecting apparatus, variation detecting method, and stor...

Decision making method

System for cooperatively operating river management facilities

Emergency information offering system

Scheduled motion planning method and apparatus for a vehicle

Method for retrieving database of image information

Navigation system and method using map data

Scanning electron microscope and method of processing the same

Method of measuring surface topography by using scanning electron m...

Method of detecting change using image

Image correction system for scanning electron microscope

Scanning electron microscope

Method of reconstructing images from synthetic aperture radar's data

Method of and apparatus for detecting heights of points on surface...

Image correction processing method

Image correction processing method and apparatus

Patents Applicationslast 30 patents

Variation detecting apparatus, variation detecting method, and stor...