Fuminori Uematsu

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Estimation model generation method and electron microscope
- Patent number 11,842,880
- Issue date Dec 12, 2023
- Jeol Ltd.
- Ryusuke Sagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray measurement apparatus and X-ray measurement method
- Patent number 11,788,976
- Issue date Oct 17, 2023
- Jeol Ltd.
- Takanori Murano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of measuring aberration and electron microscope
- Patent number 11,764,029
- Issue date Sep 19, 2023
- Jeol Ltd.
- Shigeyuki Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and machine learning method
- Patent number 11,222,241
- Issue date Jan 11, 2022
- Jeol Ltd.
- Fuminori Uematsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mass spectrum processing apparatus and model generation method
- Patent number 11,211,150
- Issue date Dec 28, 2021
- Jeol Ltd.
- Fuminori Uematsu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electron Microscope and Method of Correcting Aberration
- Publication number 20230026970
- Publication date Jan 26, 2023
- JEOL Ltd.
- Keito Aibara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Estimation Model Generation Method and Electron Microscope
- Publication number 20220262595
- Publication date Aug 18, 2022
- JEOL Ltd.
- Ryusuke Sagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Measuring Aberration and Electron Microscope
- Publication number 20220230838
- Publication date Jul 21, 2022
- JEOL Ltd.
- Shigeyuki Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-Ray Measurement Apparatus and X-Ray Measurement Method
- Publication number 20220146442
- Publication date May 12, 2022
- JEOL Ltd.
- Takanori Murano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mass Spectrum Processing Apparatus and Model Generation Method
- Publication number 20210065849
- Publication date Mar 4, 2021
- JEOL Ltd.
- Fuminori Uematsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus and Machine Learning Method
- Publication number 20190362189
- Publication date Nov 28, 2019
- JEOL Ltd.
- Fuminori Uematsu
- G06 - COMPUTING CALCULATING COUNTING