Fumio Akikuni

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Low-coherence reflectometer with polarization control
- Patent number 6,775,005
- Issue date Aug 10, 2004
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Position sensor for movable body and optical interferometer
- Patent number 6,693,714
- Issue date Feb 17, 2004
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Optical interferometer
- Patent number 6,636,317
- Issue date Oct 21, 2003
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Optical part driving device incorporated into a detachable block an...
- Patent number 6,570,658
- Issue date May 27, 2003
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Light receiving module and light receiving method with reduced pola...
- Patent number 6,560,003
- Issue date May 6, 2003
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Optical interferometer
- Patent number 6,552,801
- Issue date Apr 22, 2003
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Optical interferometer with a casing and an optical part that is mo...
- Patent number 6,504,613
- Issue date Jan 7, 2003
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling probe and measuring method using the same
- Patent number 6,469,528
- Issue date Oct 22, 2002
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling probe and a method for adjusting the same
- Patent number 6,445,198
- Issue date Sep 3, 2002
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling probe comprising photodiodes insulated from...
- Patent number 6,403,946
- Issue date Jun 11, 2002
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling prober
- Patent number 6,388,454
- Issue date May 14, 2002
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optic sampling probe having unit for adjusting quantity of...
- Patent number 6,297,651
- Issue date Oct 2, 2001
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Photoreceptacle for measuring light
- Patent number 6,076,977
- Issue date Jun 20, 2000
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Optical interferometer
- Publication number 20040042016
- Publication date Mar 4, 2004
- Ando Electric Co., Ltd.,
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Application
Low-coherence reflectometer
- Publication number 20020118363
- Publication date Aug 29, 2002
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-OPTIC SAMPLING PROBE AND MEASURING METHOD USING THE SAME
- Publication number 20020030500
- Publication date Mar 14, 2002
- FUMIO AKIKUNI
- G01 - MEASURING TESTING
Information Patent Application
Optical interferometer
- Publication number 20010026656
- Publication date Oct 4, 2001
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Application
Light receiving module and light receiving method with reduced pola...
- Publication number 20010024331
- Publication date Sep 27, 2001
- Fumio Akikuni
- G01 - MEASURING TESTING

Fumio Akikuni

Person

Patents Grantslast 30 patents

Low-coherence reflectometer with polarization control

Position sensor for movable body and optical interferometer

Optical interferometer

Optical part driving device incorporated into a detachable block an...

Light receiving module and light receiving method with reduced pola...

Optical interferometer

Optical interferometer with a casing and an optical part that is mo...

Electro-optic sampling probe and measuring method using the same

Electro-optic sampling probe and a method for adjusting the same

Electro-optic sampling probe comprising photodiodes insulated from...

Electro-optic sampling prober

Electro-optic sampling probe having unit for adjusting quantity of...

Photoreceptacle for measuring light

Patents Applicationslast 30 patents

Optical interferometer

Low-coherence reflectometer

ELECTRO-OPTIC SAMPLING PROBE AND MEASURING METHOD USING THE SAME

Optical interferometer

Light receiving module and light receiving method with reduced pola...