Fumio Inui

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Saitama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Optical characteristic measuring apparatus, the method thereof and...
- Patent number 6,678,041
- Issue date Jan 13, 2004
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical characteristic measuring apparatus, the method thereof and...
- Publication number 20020003621
- Publication date Jan 10, 2002
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING