Fumio Kobayashi

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Omiya-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample inclination measuring method
- Patent number 7,245,384
- Issue date Jul 17, 2007
- Fujinon Corporation
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Grant
Inclination adjusting apparatus, ferrule clamping apparatus, and in...
- Patent number 7,173,710
- Issue date Feb 6, 2007
- Fujinon Corporation
- Fumio Kobayashi
- G02 - OPTICS
Information Patent Grant
Method of assisting sample inclination error adjustment
- Patent number 6,947,149
- Issue date Sep 20, 2005
- Fujinon Corporation
- Fumio Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for oblique incidence interferometer and apparatus u...
- Patent number 6,643,026
- Issue date Nov 4, 2003
- Fuji Photo Optical Co., Ltd.
- Hideo Kanda
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional image scanner and heat-insulating device for opti...
- Patent number 6,636,255
- Issue date Oct 21, 2003
- Fuji Photo Optical Co., Ltd.
- Fumio Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Pattern projection measurement grating
- Patent number 6,441,909
- Issue date Aug 27, 2002
- Fuji Photo Optical Co., Ltd.
- Fumio Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Moire apparatus having projection optical system and observation op...
- Patent number 6,291,817
- Issue date Sep 18, 2001
- Fuji Photo Optical Co., Ltd.
- Fumio Kobayashi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Sample inclination measuring method
- Publication number 20040001205
- Publication date Jan 1, 2004
- Fuji Photo Optical Co., Ltd.
- Zongtao Ge
- G01 - MEASURING TESTING
Information Patent Application
Inclination adjusting apparatus, ferrule clamping apparatus, and in...
- Publication number 20030227634
- Publication date Dec 11, 2003
- Fuji Photo Optical Co., Ltd.
- Fumio Kobayashi
- G02 - OPTICS
Information Patent Application
Method of assisting sample inclination error adjustment
- Publication number 20030227633
- Publication date Dec 11, 2003
- Fuji Photo Optical Co., Ltd.
- Fumio Kobayashi
- G02 - OPTICS
Information Patent Application
Optical system for oblique incidence interferometer and apparatus u...
- Publication number 20010017697
- Publication date Aug 30, 2001
- Fuji photo optical Co., Ltd.
- Hideo Kanda
- G01 - MEASURING TESTING