Fumio Kurotori

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Contact pin probe card and electronic device test apparatus using same
- Patent number 7,667,471
- Issue date Feb 23, 2010
- Advantest Corporation
- Fumio Kurotori
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and the production method
- Patent number 7,482,821
- Issue date Jan 27, 2009
- Advantest Corporation
- Takaji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Connector, electronic component fixing device, and tester
- Patent number 7,033,196
- Issue date Apr 25, 2006
- Advantest Corp.
- Shigeru Murayama
- G01 - MEASURING TESTING
Information Patent Grant
Connector
- Patent number 6,981,898
- Issue date Jan 3, 2006
- Fujitsu Component Limited
- Junichi Akama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Connector device having narrowed pitches between terminal members
- Patent number 6,464,521
- Issue date Oct 15, 2002
- Fujitsu Takamisawa Component Limited
- Fumio Kurotori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication method of connector having internal switch
- Patent number 6,269,539
- Issue date Aug 7, 2001
- Fujitsu Takamisawa Component Limited
- Norihiro Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical contact element and circuit board connector using the same
- Patent number 6,183,283
- Issue date Feb 6, 2001
- Fujitsu Takamisawa Component Limited
- Fumio Kurotori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Connector
- Patent number 6,162,091
- Issue date Dec 19, 2000
- Fujitsu Takamisawa Component Limited
- Fumio Kurotori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Connector assembly
- Patent number 6,106,331
- Issue date Aug 22, 2000
- Fujitsu Takamisawa Component Limited
- Fumio Kurotori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Connector having internal switch and fabrication method thereof
- Patent number 6,056,590
- Issue date May 2, 2000
- Fujitsu Takamisawa Component Limited
- Norihiro Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical contact element
- Patent number 5,951,335
- Issue date Sep 14, 1999
- Fujitsu Takamisawa Component Limited
- Fumio Kurotori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mounting structure and fastener for heat sink
- Patent number 5,561,325
- Issue date Oct 1, 1996
- Fujitsu Limited
- Mitsuhiro Ueno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical connecting arrangement for establishment of electrical c...
- Patent number 5,513,995
- Issue date May 7, 1996
- Fujitsu Ltd.
- Fumio Kurotori
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Contact Pin Probe Card and Electronic Device Test Apparatus Using Same
- Publication number 20080143366
- Publication date Jun 19, 2008
- Fumio Kurotori
- G01 - MEASURING TESTING
Information Patent Application
Probe card and the production method
- Publication number 20050280428
- Publication date Dec 22, 2005
- Takaji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Connector, electronic component fixing device, and tester
- Publication number 20050159034
- Publication date Jul 21, 2005
- Shigeru Murayama
- G01 - MEASURING TESTING
Information Patent Application
Connector
- Publication number 20040029410
- Publication date Feb 12, 2004
- FUJITSU COMPONENT LIMITED
- Junichi Akama
- H01 - BASIC ELECTRIC ELEMENTS

Fumio Kurotori

Person

Patents Grantslast 30 patents

Contact pin probe card and electronic device test apparatus using same

Probe card and the production method

Connector, electronic component fixing device, and tester

Connector

Connector device having narrowed pitches between terminal members

Fabrication method of connector having internal switch

Electrical contact element and circuit board connector using the same

Connector

Connector assembly

Connector having internal switch and fabrication method thereof

Electrical contact element

Mounting structure and fastener for heat sink

Electrical connecting arrangement for establishment of electrical c...

Patents Applicationslast 30 patents

Contact Pin Probe Card and Electronic Device Test Apparatus Using Same

Probe card and the production method

Connector, electronic component fixing device, and tester

Connector