TREA

Fumio Ohtomo

Follow

Person

  • Saitama, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Inclination sensor and data acquisition device
    • Patent number 12,123,543
    • Issue date Oct 22, 2024
    • Topcon Corporation
    • Fumitoshi Kasahara
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Grant

    Tilt detecting device and surveying instrument
    • Patent number 11,940,274
    • Issue date Mar 26, 2024
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying instrument having wavelength dispersion compensation pris...
    • Patent number 11,698,254
    • Issue date Jul 11, 2023
    • TOPCON Corporation
    • Ikuo Ishinabe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying instrument
    • Patent number 11,598,637
    • Issue date Mar 7, 2023
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying instrument and surveying instrument system
    • Patent number 11,598,874
    • Issue date Mar 7, 2023
    • TOPCON Corporation
    • Fumio Ohtomo
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Surveying system
    • Patent number 11,598,854
    • Issue date Mar 7, 2023
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying instrument
    • Patent number 11,512,957
    • Issue date Nov 29, 2022
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying instrument and surveying instrument system
    • Patent number 11,506,759
    • Issue date Nov 22, 2022
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying device
    • Patent number 11,460,548
    • Issue date Oct 4, 2022
    • Topcon Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying instrument
    • Patent number 11,421,989
    • Issue date Aug 23, 2022
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying instrument
    • Patent number 11,415,414
    • Issue date Aug 16, 2022
    • TOPCON Corporation
    • Fumio Ohtomo
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Surveying instrument and surveying instrument system
    • Patent number 11,402,206
    • Issue date Aug 2, 2022
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Laser measuring method and laser measuring instrument
    • Patent number 11,402,506
    • Issue date Aug 2, 2022
    • TOPCON Corporation
    • Fumio Ohtomo
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Surveying instrument
    • Patent number 11,402,207
    • Issue date Aug 2, 2022
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying instrument
    • Patent number 11,385,052
    • Issue date Jul 12, 2022
    • TOPCON Corporation
    • Nobuyuki Nishita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying instrument
    • Patent number 11,333,496
    • Issue date May 17, 2022
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying instrument
    • Patent number 11,293,754
    • Issue date Apr 5, 2022
    • TOPCON Corporation
    • Satoshi Hirano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying instrument and photogrammetric method
    • Patent number 11,193,765
    • Issue date Dec 7, 2021
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring method and laser scanner
    • Patent number 11,150,346
    • Issue date Oct 19, 2021
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Deflecting device and surveying instrument
    • Patent number 11,035,936
    • Issue date Jun 15, 2021
    • Topcon Corporation
    • Hideyuki Matsumoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Deflecting device and surveying instrument
    • Patent number 11,029,154
    • Issue date Jun 8, 2021
    • Topcon Corporation
    • Hideyuki Matsumoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Laser scanner and surveying system
    • Patent number 10,983,196
    • Issue date Apr 20, 2021
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying system
    • Patent number 10,982,957
    • Issue date Apr 20, 2021
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying system
    • Patent number 10,921,430
    • Issue date Feb 16, 2021
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying system
    • Patent number 10,895,632
    • Issue date Jan 19, 2021
    • Topcon Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measurement device
    • Patent number 10,871,370
    • Issue date Dec 22, 2020
    • Topcon Corporation
    • Ikuo Ishinabe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying instrument
    • Patent number 10,823,558
    • Issue date Nov 3, 2020
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring instrument
    • Patent number 10,823,823
    • Issue date Nov 3, 2020
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surveying system
    • Patent number 10,816,665
    • Issue date Oct 27, 2020
    • TOPCON Corporation
    • Ken-ichiro Yoshino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Laser scanner
    • Patent number 10,809,360
    • Issue date Oct 20, 2020
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    REVERSING ACTUATION TYPE INERTIA DETECTING DEVICE AND SURVEYING INS...
    • Publication number 20220317149
    • Publication date Oct 6, 2022
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Application

    INCLINATION SENSOR AND DATA ACQUISITION DEVICE
    • Publication number 20220307646
    • Publication date Sep 29, 2022
    • TOPCON CORPORATION
    • Fumitoshi KASAHARA
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Application

    Surveying Instrument
    • Publication number 20220229182
    • Publication date Jul 21, 2022
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Surveying Instrument, Surveying Method And Surveying Program
    • Publication number 20220163328
    • Publication date May 26, 2022
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Surveying Instrument And Surveying System
    • Publication number 20210382143
    • Publication date Dec 9, 2021
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Surveying Instrument And Surveying Instrument System
    • Publication number 20210293962
    • Publication date Sep 23, 2021
    • TOPCON CORPORATION
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Tilt Detecting Device And Surveying Instrument
    • Publication number 20210116241
    • Publication date Apr 22, 2021
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Surveying Instrument And Surveying Instrument System
    • Publication number 20210088333
    • Publication date Mar 25, 2021
    • TOPCON Corporation
    • Ikuo Ishinabe
    • G01 - MEASURING TESTING
  • Information Patent Application

    Surveying Instrument
    • Publication number 20200386546
    • Publication date Dec 10, 2020
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Surveying Instrument
    • Publication number 20200386547
    • Publication date Dec 10, 2020
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Surveying Instrument
    • Publication number 20200326186
    • Publication date Oct 15, 2020
    • TOPCON Corporation
    • Nobuyuki Nishita
    • G01 - MEASURING TESTING
  • Information Patent Application

    Surveying Instrument
    • Publication number 20200318963
    • Publication date Oct 8, 2020
    • TOPCON CORPORATION
    • Satoshi Hirano
    • G01 - MEASURING TESTING
  • Information Patent Application

    Surveying Instrument
    • Publication number 20200318966
    • Publication date Oct 8, 2020
    • TOPCON Corporation
    • Satoshi Hirano
    • G01 - MEASURING TESTING
  • Information Patent Application

    Surveying Instrument And Photogrammetric Method
    • Publication number 20200182614
    • Publication date Jun 11, 2020
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Surveying Instrument And Surveying Instrument System
    • Publication number 20200096334
    • Publication date Mar 26, 2020
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Surveying Instrument
    • Publication number 20200081266
    • Publication date Mar 12, 2020
    • TOPCON CORPORATION
    • Fumio Ohtomo
    • G02 - OPTICS
  • Information Patent Application

    Surveying Instrument
    • Publication number 20190360806
    • Publication date Nov 28, 2019
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Surveying System
    • Publication number 20190346539
    • Publication date Nov 14, 2019
    • TOPCON Corporation
    • Fumio Ohtomo
    • G02 - OPTICS
  • Information Patent Application

    Surveying Instrument
    • Publication number 20190339075
    • Publication date Nov 7, 2019
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Application

    SURVEYING DEVICE
    • Publication number 20190302236
    • Publication date Oct 3, 2019
    • TOPCON CORPORATION
    • Fumio OHTOMO
    • G01 - MEASURING TESTING
  • Information Patent Application

    Surveying Instrument
    • Publication number 20190186912
    • Publication date Jun 20, 2019
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Surveying Instrument And Surveying Instrument System
    • Publication number 20190154805
    • Publication date May 23, 2019
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Laser Measuring Method And Laser Measuring Instrument
    • Publication number 20190094363
    • Publication date Mar 28, 2019
    • TOPCON CORPORATION
    • Fumio Ohtomo
    • B64 - AIRCRAFT AVIATION COSMONAUTICS
  • Information Patent Application

    Surveying System
    • Publication number 20190063922
    • Publication date Feb 28, 2019
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Laser Scanner And Surveying System
    • Publication number 20190011536
    • Publication date Jan 10, 2019
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Application

    DEFLECTING DEVICE AND SURVEYING INSTRUMENT
    • Publication number 20190004154
    • Publication date Jan 3, 2019
    • TOPCON CORPORATION
    • Hideyuki MATSUMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    Surveying Instrument And Three-Dimensional Camera
    • Publication number 20180372492
    • Publication date Dec 27, 2018
    • Kabushiki Kaisha TOPCON
    • Fumio Ohtomo
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Application

    Surveying System
    • Publication number 20180329041
    • Publication date Nov 15, 2018
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING
  • Information Patent Application

    DEFLECTING DEVICE AND SURVEYING INSTRUMENT
    • Publication number 20180328728
    • Publication date Nov 15, 2018
    • TOPCON CORPORATION
    • Hideyuki MATSUMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    Surveying System
    • Publication number 20180329040
    • Publication date Nov 15, 2018
    • TOPCON Corporation
    • Fumio Ohtomo
    • G01 - MEASURING TESTING