Fumio Sato

Person

Oita-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection device and inspection method
- Patent number 10,871,453
- Issue date Dec 22, 2020
- Kabushiki Kaisha Toshiba
- Manabu Watanabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system and inspection method
- Patent number 10,732,078
- Issue date Aug 4, 2020
- Kabushiki Kaisha Toshiba
- Manabu Watanabe
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Apparatus and method for quantitative evaluation of braze bonding l...
- Patent number 9,841,279
- Issue date Dec 12, 2017
- Kabushiki Kaisha Toshiba
- Ryosuke Ohirabaru
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Semiconductor device manufacturing system for etching a semiconduct...
- Patent number 7,067,761
- Issue date Jun 27, 2006
- Kabushiki Kaisha Toshiba
- Takanori Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device manufacturing system for etching a semiconduct...
- Patent number 6,989,073
- Issue date Jan 24, 2006
- Kabushiki Kaisha Toshiba
- Takanori Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 6,951,781
- Issue date Oct 4, 2005
- Kabushiki Kaisha Toshiba
- Mitsuhiro Omura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 6,835,999
- Issue date Dec 28, 2004
- Kabushiki Kaisha Toshiba
- Mitsuhiro Omura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device manufacturing system for etching a semiconduct...
- Patent number 6,685,797
- Issue date Feb 3, 2004
- Kabushiki Kaisha Toshiba
- Takanori Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND INSPECTION SYSTEM
- Publication number 20240114225
- Publication date Apr 4, 2024
- Kabushiki Kaisha Toshiba
- Mitsunori YUMINAMOCHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20190199179
- Publication date Jun 27, 2019
- KABUSHIKI KAISHA TOSHIBA
- Manabu WATANABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20190195740
- Publication date Jun 27, 2019
- KABUSHIKI KAISHA TOSHIBA
- Manabu WATANABE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR QUANTITATIVE EVALUATION OF BRAZE BONDING L...
- Publication number 20160265909
- Publication date Sep 15, 2016
- KABUSHIKI KAISHA TOSHIBA
- Ryosuke OHIRABARU
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20050087837
- Publication date Apr 28, 2005
- Kabushiki Kaisha Toshiba
- Mitsuhiro Omura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device manufacturing system for etching a semiconduct...
- Publication number 20040149698
- Publication date Aug 5, 2004
- KABUSHIKI KAISHA TOSHIBA
- Takanori Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device manufacturing system for etching a semiconduct...
- Publication number 20040134609
- Publication date Jul 15, 2004
- KABUSHIKI KAISHA TOSHIBA
- Takanori Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device manufacturing system for etching a semiconduct...
- Publication number 20040137746
- Publication date Jul 15, 2004
- KABUSHIKI KAISHA TOSHIBA
- Takanori Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device manufacturing system for etching a semiconduct...
- Publication number 20040134610
- Publication date Jul 15, 2004
- KABUSHIKI KAISHA TOSHIBA
- Takanori Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20040012073
- Publication date Jan 22, 2004
- Mitsuhiro Omura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device manufacturing system for etching a semiconduct...
- Publication number 20030127188
- Publication date Jul 10, 2003
- Takanori Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Inspection device and inspection method

Inspection system and inspection method

Apparatus and method for quantitative evaluation of braze bonding l...

Semiconductor device manufacturing system for etching a semiconduct...

Semiconductor device manufacturing system for etching a semiconduct...

Semiconductor device and method of manufacturing the same

Semiconductor device and method of manufacturing the same

Semiconductor device manufacturing system for etching a semiconduct...

Patents Applicationslast 30 patents

INSPECTION APPARATUS AND INSPECTION SYSTEM

INSPECTION DEVICE AND INSPECTION METHOD

INSPECTION SYSTEM AND INSPECTION METHOD

APPARATUS AND METHOD FOR QUANTITATIVE EVALUATION OF BRAZE BONDING L...

Semiconductor device and method of manufacturing the same

Semiconductor device manufacturing system for etching a semiconduct...

Semiconductor device manufacturing system for etching a semiconduct...

Semiconductor device manufacturing system for etching a semiconduct...

Semiconductor device manufacturing system for etching a semiconduct...

Semiconductor device and method of manufacturing the same

Semiconductor device manufacturing system for etching a semiconduct...