TREA

Fumitaka NISHIO

Follow

Person

  • Hamamatsu-shi, Shizuoka, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Light detection device
    • Patent number 12,113,088
    • Issue date Oct 8, 2024
    • Hamamatsu Photonics K.K.
    • Hironori Sonobe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Optical semiconductor device
    • Patent number 12,080,813
    • Issue date Sep 3, 2024
    • Hamamatsu Photonics K.K.
    • Fumitaka Nishio
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Photodetector
    • Patent number 11,901,379
    • Issue date Feb 13, 2024
    • Hamamatsu Photonics K.K.
    • Hironori Sonobe
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Electronic component, method of manufacturing electronic component,...
    • Patent number 11,462,667
    • Issue date Oct 4, 2022
    • Hamamatsu Photonics K.K.
    • Fumitaka Nishio
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    OPTICAL SEMICONDUCTOR DEVICE
    • Publication number 20220262961
    • Publication date Aug 18, 2022
    • HAMAMATSU PHOTONICS K. K.
    • Fumitaka NISHIO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    LIGHT DETECTION DEVICE
    • Publication number 20220020806
    • Publication date Jan 20, 2022
    • Hamamatsu Photonics K.K.
    • Hironori SONOBE
    • G01 - MEASURING TESTING
  • Information Patent Application

    PHOTODETECTOR
    • Publication number 20220020805
    • Publication date Jan 20, 2022
    • Hamamatsu Photonics K.K.
    • Hironori SONOBE
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRONIC COMPONENT, METHOD OF MANUFACTURING ELECTRONIC COMPONENT,...
    • Publication number 20210005801
    • Publication date Jan 7, 2021
    • Hamamatsu Photonics K.K.
    • Fumitaka NISHIO
    • H01 - BASIC ELECTRIC ELEMENTS