Fumitake TERAO

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Musashino-shi, Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Current measurement device, current measurement method, and non-tra...
- Patent number 11,988,691
- Issue date May 21, 2024
- Yokogawa Electric Corporation
- Kazuma Takenaka
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic flaw detection method, magnetic field measurement processi...
- Patent number 11,835,483
- Issue date Dec 5, 2023
- Yokogawa Electric Corporation
- Shinya Mito
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MAGNET HOLDING DEVICE, MAGNETIZATION DEVICE, AND MAGNETIZING METHOD
- Publication number 20230317339
- Publication date Oct 5, 2023
- YOKOGAWA ELECTRIC CORPORATION
- Shoma TAKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC FLAW DETECTION METHOD, MAGNETIC FIELD MEASUREMENT PROCESSI...
- Publication number 20230108846
- Publication date Apr 6, 2023
- YOKOGAWA ELECTRIC CORPORATION
- Shinya MITO
- G01 - MEASURING TESTING
Information Patent Application
CURRENT MEASUREMENT DEVICE, CURRENT MEASUREMENT METHOD, AND NON-TRA...
- Publication number 20220244295
- Publication date Aug 4, 2022
- YOKOGAWA ELECTRIC CORPORATION
- Kazuma TAKENAKA
- G01 - MEASURING TESTING