Fumito Sakamoto

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray metering apparatus, and X-ray metering method
- Patent number 8,345,824
- Issue date Jan 1, 2013
- IHI Corporation
- Hiroyuki Nose
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Charged particle beam decelerating device and method, and X-ray gen...
- Patent number 8,138,678
- Issue date Mar 20, 2012
- IHI Corporation
- Daisuke Ishida
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
High brightness X-ray generating device and method
- Patent number 8,102,968
- Issue date Jan 24, 2012
- IHI Corporation
- Hiroyuki Nose
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Device and method for adjusting collision timing between electron b...
- Patent number 8,000,448
- Issue date Aug 16, 2011
- IHI Corporation
- Hiroyuki Nose
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Device and method for measuring profiles of electron beam and laser...
- Patent number 7,817,288
- Issue date Oct 19, 2010
- IHI Corporation
- Daisuke Ishida
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
X-RAY METERING APPARATUS, AND X-RAY METERING METHOD
- Publication number 20110026679
- Publication date Feb 3, 2011
- IHI Corporation
- Hiroyuki Nose
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
HIGH BRIGHTNESS X-RAY GENERATING DEVICE AND METHOD
- Publication number 20110013749
- Publication date Jan 20, 2011
- IHI CORPORATION
- Hiroyuki Nose
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
DEVICE AND METHOD FOR ADJUSTING COLLISION TIMING BETWEEN ELECTRON B...
- Publication number 20110007875
- Publication date Jan 13, 2011
- IHI CORPORATION
- Hiroyuki Nose
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
CHARGED PARTICLE BEAM DECELERATING DEVICE AND METHOD, AND X-RAY GEN...
- Publication number 20100080356
- Publication date Apr 1, 2010
- IHI Corporation
- Daisuke Ishida
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Device and method for measuring profiles of electron beam and laser...
- Publication number 20090051937
- Publication date Feb 26, 2009
- IHI Corporation
- Daisuke Ishida
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR