Fumiya NEHASHI

Person

  • Tokyo, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Automated analysis system

    • Patent number 10,962,559
    • Issue date Mar 30, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Fumiya Nehashi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYZER

    • Publication number 20220196691
    • Publication date Jun 23, 2022
    • Hitachi High-Tech Corporation
    • Eiichiro Takada
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS SYSTEM

    • Publication number 20200278365
    • Publication date Sep 3, 2020
    • Hitachi High-Technologies Corporation
    • Fumiya NEHASHI
    • G01 - MEASURING TESTING