Membership
Tour
Register
Log in
Fumiya NEHASHI
Follow
Person
Tokyo, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Automated analysis system
Patent number
10,962,559
Issue date
Mar 30, 2021
HITACHI HIGH-TECH CORPORATION
Fumiya Nehashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20220196691
Publication date
Jun 23, 2022
Hitachi High-Tech Corporation
Eiichiro Takada
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED ANALYSIS SYSTEM
Publication number
20200278365
Publication date
Sep 3, 2020
Hitachi High-Technologies Corporation
Fumiya NEHASHI
G01 - MEASURING TESTING