Futoshi Igaue

Person

Itami-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for reducing power consumption of memory device
- Patent number 10,910,055
- Issue date Feb 2, 2021
- Renesas Electronics Corporation
- Futoshi Igaue
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device including TCAM cell arrays capable of skipping...
- Patent number 10,366,755
- Issue date Jul 30, 2019
- Renesas Electronics Corporation
- Naoya Watanabe
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and information processing system
- Patent number 10,121,541
- Issue date Nov 6, 2018
- Renesas Electronics Corporation
- Futoshi Igaue
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device including TCAM cell arrays capable of skipping...
- Patent number 10,068,646
- Issue date Sep 4, 2018
- Renesas Electronics Corporation
- Naoya Watanabe
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device including TCAM cell arrays capable of skipping...
- Patent number 9,824,757
- Issue date Nov 21, 2017
- Renesas Electronics Corporation
- Naoya Watanabe
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device including internal voltage generation circuit
- Patent number 8,599,639
- Issue date Dec 3, 2013
- Renesas Electronics Corporation
- Mihoko Akiyama
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor device including internal voltage generation circuit
- Patent number 8,451,678
- Issue date May 28, 2013
- Renesas Electronics Corporation
- Mihoko Akiyama
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor device including internal voltage generation circuit
- Patent number 8,004,923
- Issue date Aug 23, 2011
- Renesas Electronics Corporation
- Mihoko Akiyama
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor device including internal voltage generation circuit
- Patent number 7,656,736
- Issue date Feb 2, 2010
- Renesas Technology Corp.
- Mihoko Akiyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device undergoing defect detection test
- Patent number 7,408,818
- Issue date Aug 5, 2008
- Renesas Technology Corp.
- Kenji Yoshinaga
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20190164608
- Publication date May 30, 2019
- RENESAS ELECTRONICS CORPORATION
- Futoshi IGAUE
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING TCAM CELL ARRAYS CAPABLE OF SKIPPING...
- Publication number 20180350439
- Publication date Dec 6, 2018
- RENESAS ELECTRONICS CORPORATION
- Naoya WATANABE
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING TCAM CELL ARRAYS CAPABLE OF SKIPPING...
- Publication number 20180040373
- Publication date Feb 8, 2018
- RENESAS ELECTRONICS CORPORATION
- Naoya WATANABE
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20170062051
- Publication date Mar 2, 2017
- RENESAS ELECTRONICS CORPORATION
- Naoya WATANABE
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND INFORMATION PROCESSING SYSTEM
- Publication number 20170060438
- Publication date Mar 2, 2017
- RENESAS ELECTRONICS CORPORATION
- Futoshi IGAUE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING INTERNAL VOLTAGE GENERATION CIRCUIT
- Publication number 20130249624
- Publication date Sep 26, 2013
- RENESAS ELECTRONICS CORPORATION
- Mihoko Akiyama
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING INTERNAL VOLTAGE GENERATION CIRCUIT
- Publication number 20110182131
- Publication date Jul 28, 2011
- RENESAS ELECTRONICS CORPORATION
- Mihoko Akiyama
- G05 - CONTROLLING REGULATING
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING INTERNAL VOLTAGE GENERATION CIRCUIT
- Publication number 20100109761
- Publication date May 6, 2010
- Renesas Technology Corp.
- Mihoko Akiyama
- G05 - CONTROLLING REGULATING
Information Patent Application
SEMICONDUCTOR DEVICE UNDERGOING DEFECT DETECTION TEST
- Publication number 20080298156
- Publication date Dec 4, 2008
- Renesas Technology Corp.
- Kenji Yoshinaga
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device including internal voltage generation circuit
- Publication number 20070216467
- Publication date Sep 20, 2007
- RENESAS TECHNOLOGY CORP.
- Mihoko Akiyama
- G05 - CONTROLLING REGULATING
Information Patent Application
Semiconductor device undergoing defect detection test
- Publication number 20070183214
- Publication date Aug 9, 2007
- RENESAS TECHNOLOGY CORP.
- Kenji Yoshinaga
- G11 - INFORMATION STORAGE

Futoshi Igaue

Person

Patents Grantslast 30 patents

System and method for reducing power consumption of memory device

Semiconductor device including TCAM cell arrays capable of skipping...

Semiconductor device and information processing system

Semiconductor device including TCAM cell arrays capable of skipping...

Semiconductor device including TCAM cell arrays capable of skipping...

Semiconductor device including internal voltage generation circuit

Semiconductor device including internal voltage generation circuit

Semiconductor device including internal voltage generation circuit

Semiconductor device including internal voltage generation circuit

Semiconductor device undergoing defect detection test

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE INCLUDING TCAM CELL ARRAYS CAPABLE OF SKIPPING...

SEMICONDUCTOR DEVICE INCLUDING TCAM CELL ARRAYS CAPABLE OF SKIPPING...

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND INFORMATION PROCESSING SYSTEM

SEMICONDUCTOR DEVICE INCLUDING INTERNAL VOLTAGE GENERATION CIRCUIT

SEMICONDUCTOR DEVICE INCLUDING INTERNAL VOLTAGE GENERATION CIRCUIT

SEMICONDUCTOR DEVICE INCLUDING INTERNAL VOLTAGE GENERATION CIRCUIT

SEMICONDUCTOR DEVICE UNDERGOING DEFECT DETECTION TEST

Semiconductor device including internal voltage generation circuit

Semiconductor device undergoing defect detection test