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Futoshi Iwata
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Hamamatsu-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Contact state detection apparatus
Patent number
9,118,331
Issue date
Aug 25, 2015
National University Corporation Shizuoka University
Futoshi Iwata
G01 - MEASURING TESTING
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Patent Grant
Micro-machining dust removing device, micro-machining apparatus, an...
Patent number
8,062,494
Issue date
Nov 22, 2011
National University Corporation Shizuoka University
Futoshi Iwata
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
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Patent Application
Contact State Detection Apparatus
Publication number
20140203168
Publication date
Jul 24, 2014
Futoshi Iwata
G01 - MEASURING TESTING
Information
Patent Application
Micro-machining dust removing device, micro-machining apparatus, an...
Publication number
20080132151
Publication date
Jun 5, 2008
National University Corporation Shizuoka University
Futoshi Iwata
B82 - NANO-TECHNOLOGY