Futoshi Ojima

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Kobe-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Crystalline quality evaluation apparatus for thin-film semiconducto...
- Patent number 8,952,338
- Issue date Feb 10, 2015
- Kobe Steel, Ltd.
- Naokazu Sakoda
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for measuring lifetime of carriers in semic...
- Patent number 5,760,597
- Issue date Jun 2, 1998
- Kabushiki Kaisha Kobe Seiko Sho
- Naoyuki Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring the life time of minority carriers of a sem...
- Patent number 5,438,276
- Issue date Aug 1, 1995
- Kabushiki Kaisha Kobe Seiko Sho
- Yutaka Kawata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CRYSTALLINE QUALITY EVALUATION APPARATUS FOR THIN-FILM SEMICONDUCTO...
- Publication number 20130153778
- Publication date Jun 20, 2013
- KOBELCO RESEARCH INSTITUTE, INC.
- Naokazu Sakoda
- G01 - MEASURING TESTING