Futoshi UEKI

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray imaging apparatus
- Patent number 11,662,322
- Issue date May 30, 2023
- Shimadzu Corporation
- Bunta Matsuhana
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection device, management server for X-ray inspection dev...
- Patent number 11,656,189
- Issue date May 23, 2023
- Shimadzu Corporation
- Futoshi Ueki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray generation device, X-ray fluoroscopic image photographing dev...
- Patent number 10,631,391
- Issue date Apr 21, 2020
- Shimadzu Corporation
- Futoshi Ueki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection system
- Patent number 10,398,012
- Issue date Aug 27, 2019
- Shimadzu Corporation
- Bunta Matsuhana
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20220170868
- Publication date Jun 2, 2022
- Shimadzu Corporation
- Bunta MATSUHANA
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY INSPECTION DEVICE, MANAGEMENT SERVER FOR X-RAY INSPECTION DEV...
- Publication number 20220155244
- Publication date May 19, 2022
- Shimadzu Corporation
- Futoshi UEKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY GENERATION DEVICE, X-RAY FLUOROSCOPIC IMAGE PHOTOGRAPHING DEV...
- Publication number 20190082524
- Publication date Mar 14, 2019
- Shimadzu Corporation
- Futoshi UEKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION SYSTEM
- Publication number 20180110115
- Publication date Apr 19, 2018
- Shimadzu Corporation
- Bunta MATSUHANA
- G01 - MEASURING TESTING