Fuyuhiko Inoue

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Sagamihara-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Optical component comprising liquid crystals in a blue phase and pr...
- Patent number 11,231,608
- Issue date Jan 25, 2022
- NIKON CORPORATION
- Eva Oton
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Scanning exposure method
- Patent number RE38176
- Issue date Jul 8, 2003
- Nikon Corporation
- Shinji Wakamoto
- 355 - Photocopying
Information Patent Grant
Interferometer system
- Patent number 6,509,971
- Issue date Jan 21, 2003
- Nikon Corporation
- Fuyuhiko Inoue
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Scanning exposure method
- Patent number 5,617,182
- Issue date Apr 1, 1997
- Nikon Corporation
- Shinji Wakamoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Laser beam depicting apparatus
- Patent number 4,971,413
- Issue date Nov 20, 1990
- Nikon Corporation
- Fuyuhiko Inoue
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Laser beam scanning pattern generation system with positional and d...
- Patent number 4,761,561
- Issue date Aug 2, 1988
- Nippon Kogaku K.K.
- Yoshihisa Fujiwara
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL COMPONENT COMPRISING LIQUID CRYSTALS IN A BLUE PHASE AND PR...
- Publication number 20190250438
- Publication date Aug 15, 2019
- Nikon Corporation
- Eva OTON
- G02 - OPTICS
Information Patent Application
INTERFEROMETER SYSTEM
- Publication number 20020167675
- Publication date Nov 14, 2002
- Fuyuhiko Inoue
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Wavefront aberration measuring method and unit, exposure apparatus,...
- Publication number 20020159048
- Publication date Oct 31, 2002
- Nikon Corporation
- Fuyuhiko Inoue
- G01 - MEASURING TESTING