G. Jonathan Kluth

Follow

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement of lateral diffusion of diffused layers
- Patent number 6,878,559
- Issue date Apr 12, 2005
- Applied Materials, Inc.
- Peter G. Borden
- G01 - MEASURING TESTING
Information Patent Grant
Method of forming a CMOS transistor having ultra shallow source and...
- Patent number 6,521,501
- Issue date Feb 18, 2003
- Advanced Micro Devices, Inc.
- Jeff Erhardt
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT OF LATERAL DIFFUSION OF DIFFUSED LAYERS
- Publication number 20040063225
- Publication date Apr 1, 2004
- Peter G. Borden
- G01 - MEASURING TESTING